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dc.contributor.authorChavan, D.C.en_US
dc.contributor.authorGruca, G.L.en_US
dc.contributor.authorMan, S.P.J. deen_US
dc.contributor.authorSlaman, M.J.en_US
dc.contributor.authorRector, J.H.en_US
dc.contributor.authorHeeck, K.en_US
dc.contributor.authorIannuzzi, D.en_US
dc.date.accessioned2012-05-09T08:10:35Z
dc.date.issued2010en_US
dc.identifier.citationReview of Scientific Instruments, 81(123702)en_US
dc.identifier.issn0034-6748
dc.identifier.urihttp://hdl.handle.net/1871/34432
dc.relation.uri10.1063/1.3516044
dc.titleFerrule-top atomic force microscopeen_US
dc.typeArticle / Letter to editoren_US
dc.creator.metisIdVU1012747
dc.creator.metisIdVU1011015
dc.creator.metisIdVU1056643
dc.creator.metisIdVU1011072
dc.creator.metisIdVU1011000
dc.creator.metisIdVU1039920
dc.creator.metisIdVU1070535
dc.identifier.metisId259282
dc.provenance.metis2011-03-08 00:00
dc.source.volume81
dc.source.journalTitleReview of Scientific Instrumentsen_US
dc.source.issue123702
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.creator.facultyExterne instellingnl_NL
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.coverage.researchinstituteVU FEW 02040000nl_NL
dc.coverage.researchinstituteVU LaserLaB 07nl_NL
dc.date.updated2015-06-04T00:30:01Z


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