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dc.contributor.authorLeeuwen, K.A.H. vanen_US
dc.contributor.authorEliel, E.R.en_US
dc.contributor.authorHogervorst, W.en_US
dc.date.accessioned2011-12-02T12:52:28Z
dc.date.issued1980en_US
dc.identifier.citationPhysics Letters A, 78(1), 54-56en_US
dc.identifier.issn0375-9601
dc.identifier.urihttp://hdl.handle.net/1871/31055
dc.relation.uri10.1016/0375-9601(80)90805-1
dc.titleHIGH-RESOLUTION MEASUREMENTS OF THE HYPERFINE-STRUCTURE IN 10 LEVELS OF TM-Ien_US
dc.typeArticle / Letter to editoren_US
dc.creator.metisIdVU1093639
dc.creator.metisIdVU1100161
dc.creator.metisIdVU1016070
dc.identifier.metisId224328
dc.provenance.metis2009-08-27 13:39
dc.source.volume78
dc.source.journalTitlePhysics Letters Aen_US
dc.source.startpage54
dc.source.endpage56
dc.source.issue1
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.coverage.researchinstituteVU FEW 02050000nl_NL
dc.date.updated2014-05-03T01:01:20Z


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