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dc.contributor.authorSalumbides, E.J.en_US
dc.contributor.authorMaslinskas, V.en_US
dc.contributor.authorDildar, I.M.en_US
dc.contributor.authorWolf, A.L.en_US
dc.contributor.authorDuijn, E.J. vanen_US
dc.contributor.authorEikema, K.S.E.en_US
dc.contributor.authorUbachs, W.M.G.en_US
dc.date.accessioned2011-12-02T09:17:58Z
dc.date.available2011-12-02T09:17:58Z
dc.date.issued2011en_US
dc.identifier.citationPhysical Review A, 83, 012502en_US
dc.identifier.issn1050-2947
dc.identifier.urihttp://hdl.handle.net/1871/30747
dc.titleHigh precision frequency measurement of the 423 nm Ca I lineen_US
dc.typeArticle / Letter to editoren_US
dc.creator.metisIdVU1011043
dc.creator.metisIdVU1131202
dc.creator.metisIdVU1131203
dc.creator.metisIdVU1011749
dc.creator.metisIdVU1045346
dc.creator.metisIdVU1036531
dc.creator.metisIdVU1015945
dc.identifier.metisId248974
dc.provenance.metis2011-01-11 00:00
dc.source.volume83
dc.source.journalTitlePhysical Review Aen_US
dc.source.startpage012502
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.creator.facultyFaculteit der Exacte Wetenschappennl_NL
dc.coverage.researchinstituteVU LaserLaB 07nl_NL
dc.coverage.researchinstituteVU FEW 02050000nl_NL
dc.date.updated2014-06-07T23:23:10Z


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