Deep-ultraviolet frequency metrology with a narrowband titanium:sapphire laser
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Within the framework of this thesis resaerch project a narrow band titanium:sapphire laser was built. It provides nanosecond pulses that are subsequently upconverted to the deep ultraviolet frequency range. Absolute frequency calibration is achieved by linking the injection seeding light to a femtosecond frequency comb. Doppler shifts were minimized using an interferometric alignment scheme. Chirp analysis techniques are applied to reduce frequency deviations between seed light and pulsed output. The combination of these techniques provides a versatile instrument for frequency metrology in a wide wavelength range. This thesis research was performed at the Laser Centre of the Vrije Universiteit Amsterdam.